Incident and transmitted light microscopes Panthera TEC MAT

Incident and transmitted light microscopes for science materials, inspection of semiconductor components, LCD displays and wafers, equipped with an intelligent brightfield / darkfield illumination concept. The microscope models with additionally integrated LED transmitted light expand the application options in the direction of complex composite materials.
-Tube type Siedentopf, swiveling
-Widefield oculars for spectacle wearers with diopter adjustment on both oculars
-CCIS^® Plan Achromat & S-APO (PB free), DIN objectives
-Reversed coded nosepiece
-LED incident light illuminator with field and aperture diaphragm, with slots for polariser / analyser sliders
-With interchangeable illumination
-Motic LightTracer: Light memory, sleep mode (auto on-off), nosepiece LED light intensity and mode indicator
-Coaxial coarse and fine focusing system with tension adjustment
-Integrated power supply with sleep mode
-USB 2.0 for external camera power

Additional equipment depending on the model with bright field (transmitted light), segmentable dark field (reflected light), polarization (reflected light)

Scope of supply: Dust cover, power cord, allen key, screws for metal extension support